Rakhimov N. R, Turaev B. E, Ulugov B. D, Ulugbek Ulugov, Eshqarayev A. X. Study of the reliability of Light-Emitting Diodes to the impact of Mechanical and Climatic Loads. Mid. Eur. Scin. Bul [Internet]. 2021Mar.11 [cited 2024Nov.23];10. Available from: https://cejsr.academicjournal.io/index.php/journal/article/view/320